The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Mar. 21, 2019
Applicant:

Mit Semiconductor Pte Ltd, Singapore, SG;

Inventors:

Kok Weng Wong, Singapore, SG;

Albert Archwamety, Singapore, SG;

Jun Kang Ng, Singapore, SG;

Chee Chye Lee, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); H04N 23/951 (2023.01); G06T 7/586 (2017.01); G01N 21/88 (2006.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
H04N 23/951 (2023.01); G01N 21/88 (2013.01); G06T 3/4015 (2013.01); G06T 7/586 (2017.01); G06T 2207/10024 (2013.01);
Abstract

The present invention includes a system and method for obtaining high-resolution images of objects such as electrical components. The system includes a monochrome camera and three light sources of different wavelengths (e.g. a red light source, a blue light source and a green light source). The camera successively captures a red light image, a blue light image and a green light image of the object. A processor combines the red light image, the blue light image and the green light image into a single high-resolution true color image. Because each image is obtained from an independent light source, the resolution is not limited by the Bayer (RGB) color model. The system is well suited for materials composed of different materials that may react differently to light sources based on its wavelength.


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