The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Apr. 21, 2023
Applicants:

David E. Newman, Poway, CA (US);

R. Kemp Massengill, Palos Verdes, CA (US);

Inventors:

David E. Newman, Poway, CA (US);

R. Kemp Massengill, Palos Verdes, CA (US);

Assignee:

ULTRALOGIC 6G LLC, Palos Verdes Estates, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/20 (2006.01);
U.S. Cl.
CPC ...
H04L 1/206 (2013.01); H04L 1/201 (2013.01);
Abstract

Message faults are an increasing problem for 5G and expected 6G networks, due to growth, crowding, and signal fading problems. Disclosed are procedures for determining which particular message element of a corrupted message is faulted, and optionally the most likely correction. A receiver can identify the faulted message element by measuring the fluctuations, in phase and amplitude, of the waveform of each message element, as well as the modulation quality, frequency offset, and other signal measurements. Faulted message elements are likely to have higher fluctuations, higher modulation deviations, and higher signal irregularities, than the unfaulted ones. Mitigation can then be applied to the faulted message elements, thereby recovering the correct message and avoiding a costly retransmission delay. AI models may enhance the fault detection sensitivity by exploiting correlations between the various waveform measurement parameters, and then may predict the corrected value of the faulted message elements.


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