The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Nov. 16, 2021
Applicant:

Xilinx, Inc., San Jose, CA (US);

Inventors:

Nakul Narang, Singapore, SG;

Siok Wei Lim, Singapore, SG;

Luhui Chen, Singapore, SG;

Yipeng Wang, Singapore, SG;

Kee Hian Tan, Singapore, SG;

Assignee:

XILINX, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/02 (2006.01); H03K 19/17736 (2020.01); G06F 13/10 (2006.01); H03K 19/17788 (2020.01); H04J 3/04 (2006.01);
U.S. Cl.
CPC ...
H03K 19/17744 (2013.01); G06F 13/102 (2013.01); H03K 19/17788 (2013.01); H04J 3/047 (2013.01); H04L 25/0272 (2013.01);
Abstract

A transmit driver architecture with a test mode (e.g., a JTAG configuration mode), extended equalization range, and/or multiple power supply domains. One example transmit driver circuit generally includes one or more driver unit cells having a differential input node pair configured to receive an input data signal and having a differential output node pair configured to output an output data signal; a plurality of power switches coupled between the differential output node pair and one or more power supply rails; a first set of one or more drivers coupled between a first test node of a differential test data path and a first output node of the differential output node pair; and a second set of one or more drivers coupled between a second test node of the differential test data path and a second output node of the differential output node pair.


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