The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Apr. 23, 2020
Applicant:
King Abdullah University of Science and Technology, Thuwal, SA;
Inventors:
Bin Xin, Thuwal, SA;
Iman S. Roqan, Thuwal, SA;
Assignee:
KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY, Thuwal, SA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/08 (2006.01); G01T 1/24 (2006.01); H01L 31/0224 (2006.01); H01L 31/032 (2006.01);
U.S. Cl.
CPC ...
H01L 31/085 (2013.01); G01T 1/241 (2013.01); H01L 31/022408 (2013.01); H01L 31/032 (2013.01);
Abstract
An X-ray system includes an X-ray generation unit configured to generate X-rays; an X-ray detection unit including at least one X-ray sensor that includes an indirect bandgap, perovskite semiconductor material, the X-ray sensor being configured to record the X-rays; and a control unit that controls a generation of the X-rays and a detection of the X-rays at the X-ray detection unit.
Xin, Bin. (2023). Indirect bandgap, perovskite-based x-ray detector and method (U.S. Patent No. 11824132). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11824132
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile