The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Dec. 21, 2016
Applicant:

Giesecke+devrient Currency Technology Gmbh, Munich, DE;

Inventors:

Wolfgang Rauscher, Parkstetten, DE;

Erich Kerst, Unterföhring, DE;

Thomas Happ, Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07D 7/20 (2016.01); G07D 7/1205 (2016.01); G07D 7/202 (2016.01); G07D 7/162 (2016.01); B42D 25/29 (2014.01); B42D 25/328 (2014.01); B42D 25/373 (2014.01);
U.S. Cl.
CPC ...
G07D 7/2016 (2013.01); G07D 7/1205 (2017.05); G07D 7/162 (2013.01); G07D 7/205 (2013.01); B42D 25/29 (2014.10); B42D 25/328 (2014.10); B42D 25/373 (2014.10); G07D 2207/00 (2013.01);
Abstract

The present invention relates to a method, a sensor, a sensor unit and a bank-note processing machine for checking the completeness and/or authenticity of value documents. A value document comprises at least one machine-readable feature substance in at the least two locations. According to the method, the value document is excited at least locally at measuring locations. Furthermore, a feature intensity with respect to the machine-readable feature substance is captured location-resolved at several different locations of the value document. The location-based feature intensities are classified location-based with the help of a threshold value. Furthermore, location-based limits of a location distribution to be expected of the machine-readable feature substance are determined. Finally, a location-based distribution of the classified feature intensities is assessed.


Find Patent Forward Citations

Loading…