The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Sep. 06, 2018
Applicant:
Sony Group Corporation, Tokyo, JP;
Inventor:
Tetsu Ogawa, Tokyo, JP;
Assignee:
Sony Group Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/10 (2022.01); G06T 7/00 (2017.01); G06T 5/50 (2006.01); G06V 10/143 (2022.01); G06V 10/26 (2022.01); G06V 10/58 (2022.01);
U.S. Cl.
CPC ...
G06V 20/188 (2022.01); G06T 5/50 (2013.01); G06T 7/97 (2017.01); G06V 10/143 (2022.01); G06V 10/267 (2022.01); G06T 2207/10036 (2013.01); G06T 2207/30188 (2013.01); G06V 10/58 (2022.01); G06V 20/194 (2022.01);
Abstract
There is achieved short-time measurement of a measurement target such as a farm field with high accuracy. Therefore, processing is performed on a sampling image obtained by the imaging of a part of a range as a measurement target with a multi spectrum camera that performs imaging to capture images in a plurality of different wavelength bands. Then, arithmetic processing is performed on the sampling image as a processing target to generate a calculation result image serving as evaluation information for the entire measurement target.