The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
May. 12, 2023
Nanjing University of Aeronautics and Astronautics, Nanjing, CN;
Nanjing University of Aeronautics and Astronautics, Nanjing, CN;
Abstract
A few-shot defect detection method based on metric learning, including: (S1) performing data enhancement on a to-be-detected few-shot defect data set through a G-Generative adversarial network (G-GAN); (S2) extracting features of a defect data set similar to the to-be-detected few-shot defect data set based on an adaptive convolution kernel-based convolutional neural network (SKM-CNN) to generate a pre-training model; and (S3) transferring the pre-training model to a few-shot defect detection network (SDN) based on metric learning; and performing target feature extraction and metric learning in sequence to realize rapid identification and location of defects.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile