The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

May. 26, 2021
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventor:

Vikram Vijayanbabu Appia, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G01C 11/02 (2006.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); G06V 20/64 (2022.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G01C 11/025 (2013.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); G06V 20/64 (2022.01); G06T 2207/20012 (2013.01);
Abstract

A method of image processing in a structured light imaging system is provided that includes receiving a captured image of a scene, wherein the captured image is captured by a camera of a projector-camera pair, and wherein the captured image includes a binary pattern projected into the scene by the projector, applying a filter to the rectified captured image to generate a local threshold image, wherein the local threshold image includes a local threshold value for each pixel in the rectified captured image, and extracting a binary image from the rectified captured image wherein a value of each location in the binary image is determined based on a comparison of a value of a pixel in a corresponding location in the rectified captured image to a local threshold value in a corresponding location in the local threshold image.


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