The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Nov. 17, 2020
Applicant:

C3.ai, Inc., Redwood City, CA (US);

Inventors:

Adrian Albert, San Francisco, CA (US);

Mehdi Maasoumy Haghighi, Redwood City, CA (US);

Assignee:

C3.ai, Inc., Redwood City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 50/06 (2012.01); G06Q 10/0637 (2023.01); G06N 20/20 (2019.01); G06N 5/01 (2023.01); G06N 7/01 (2023.01); G06N 5/022 (2023.01);
U.S. Cl.
CPC ...
G06Q 50/06 (2013.01); G06N 5/01 (2023.01); G06N 5/022 (2013.01); G06N 7/01 (2023.01); G06N 20/20 (2019.01); G06Q 10/06375 (2013.01);
Abstract

A computer system receives customer records listing customer attributes and an adoption status of the customer, such as whether the customer has enrolled in a particular energy efficiency program. An initial set of patterns are identified among the customer records, such as according to a decision tree. The initial set is pruned to obtain a set of patterns that meet minimum support and effectiveness and maximum overlap requirements. The patterns are assigned to segments according to an optimization algorithm that seeks to maximize the minimum effectiveness of each segment, where the effectiveness indicates a number of customers matching the pattern of each segment that have positive adoption status. The optimization algorithm may be a bisection algorithm that evaluates a linear-fractional integer program (LFIP-F) to iteratively approach an optimal distribution of patterns.


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