The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Dec. 10, 2019
Hitachi, Ltd., Tokyo, JP;
Kosuke Oshima, Tokyo, JP;
Masumi Kawakami, Tokyo, JP;
Makoto Ichii, Tokyo, JP;
Akihiro Hori, Tokyo, JP;
Yasufumi Suzuki, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
Provided is a test facility management system that can evaluate, in a software development process requiring use of test facilities, progress of a process caused by increasing or decreasing a count of the test facilities. The test facility management system can include: a project progress forecast unit that stores a process information database, a facility reservation information database, a process progress history information database, and facility count proposed change information, calculates facility usage remaining time period for the software development process based on process progress history information, specifies a time range during which facilities of the count of proposed change are available, and forecasts, based on the available time range, the progress of the software development process when work for the facility usage remaining time period is carried out by the facilities of the count of the proposed change; and a user interface that outputs the forecasted progress information.