The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Dec. 08, 2022
Applicant:

Deepnorth Inc., Redwood City, CA (US);

Inventors:

Jinjun Wang, San Jose, CA (US);

Xiaomeng Xin, Xi'an, CN;

Assignee:

DEEP NORTH, INC., Redwood City, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 18/214 (2023.01); G06F 18/23 (2023.01); G06F 18/21 (2023.01); G06N 3/045 (2023.01); G06V 20/52 (2022.01); G06V 40/10 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 18/217 (2023.01); G06F 18/2155 (2023.01); G06F 18/23 (2023.01); G06N 3/045 (2023.01); G06V 20/52 (2022.01); G06V 40/10 (2022.01);
Abstract

A semi-supervised model incorporates deep feature learning and pseudo label estimation into a unified framework. The deep feature learning can include multiple convolutional neural networks (CNNs). The CNNs can be trained on available training datasets, tuned using a small amount of labeled training samples, and stored as the original models. Features are then extracted for unlabeled training samples by utilizing the original models. Multi-view clustering is used to cluster features to generate pseudo labels. Then the original models are tuned by using an updated training set that includes labeled training samples and unlabeled training samples with pseudo labels. Iterations of multi-view clustering and tuning using an updated training set can continue until the updated training set is stable.


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