The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Jul. 24, 2018
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Do-yun Kim, Gwacheon-si, KR;
Han-young Yim, Suwon-si, KR;
Byeoung-su Kim, Hwaseong-si, KR;
Nak-woo Sung, Yongin-si, KR;
Jong-han Lim, Seoul, KR;
Sang-hyuck Ha, Yongin-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/048 (2023.01); G06F 17/18 (2006.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/048 (2023.01); G06F 17/18 (2013.01); G06N 3/08 (2013.01);
Abstract
An artificial neural network (ANN) quantization method for generating an output ANN by quantizing an input ANN includes: obtaining second parameters by quantizing first parameters of the input ANN; obtaining a sample distribution from an intermediate ANN in which the obtained second parameters have been applied to the input ANN; and obtaining a fractional length for the sample distribution by quantizing the obtained sample distribution.