The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Sep. 07, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Ryo Fujita, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06F 3/1256 (2013.01); G06F 3/121 (2013.01); G06F 3/1208 (2013.01); G06T 7/001 (2013.01); G06T 2200/24 (2013.01); G06T 2207/30144 (2013.01);
Abstract

An inspection apparatus that performs quality inspection on a printed matter printed by a printer using a reference image and a scanned image of the printed matter. When inspecting the quality of the printed matter, selection is performed as to which to use as the reference image, a pre-printed image for use in printing the printed matter, or the scanned image. In a case where a difference is detected as a result of comparison between the pre-printed image and the scanned image, a reference image selection screen including the pre-printed image and the scanned image is displayed. A user input is received concerning whether or not the detected difference is a defect. The reference image is selected based on the received user input.


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