The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Oct. 13, 2021
Cerner Innovation, Inc., Kansas City, KS (US);
Matt R. Anderson, Kansas City, MO (US);
Jason Mitchell, Lees Summit, MO (US);
CERNER INNOVATION, INC., Kansas City, MO (US);
Abstract
Disclosed are various methods of presenting result visualizations for test results. The visualization may include a timeline, a test label area, a test parameter indicator, and a test value representation. The test label area includes a test label associated with the test. The test parameter indicator is associated with the test provided at a location corresponding with the test label of the test label area and with a location corresponding to a test time of the timeline, including a first test parameter indicator end associated with the upper test parameter threshold and a second test parameter indicator end associated with a lower test parameter threshold. The test value representation of a test value extends away from the test parameter indicator and proportionally represents the test value relative to an upper test limit and the test value to a lower test limit.