The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Dec. 30, 2019
Applicant:

Trend Micro Incorporated, Tokyo, JP;

Inventors:

Jayson Pryde, Metro Manila, PH;

Bernard Bisuna, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/56 (2013.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 21/565 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06F 2221/034 (2013.01);
Abstract

Features of sample files that are known to be normal are extracted by random projection. The random projection values of the sample files are used as training data to generate one or more anomaly detection models. Features of a target file being inspected are extracted by generating a random projection value of the target file. The random projection value of the target file is input to an anomaly detection model to determine whether or not the target file has features that are novel relative to the sample files. The target file is declared to be an outlier when an anomaly detection model generates an inference that indicates that the target file has novel features.


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