The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Apr. 23, 2021
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Ly Vessels, Chandler, AZ (US);

Asongu Tambo, Easgan, NM (US);

Assignee:

HONEYWELL INTERNATIONAL INC., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); H04L 9/08 (2006.01); H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
G06F 21/552 (2013.01); H04L 9/0825 (2013.01); H04L 9/0897 (2013.01); H04L 63/0428 (2013.01); G06F 2221/034 (2013.01);
Abstract

Disclosed are methods, systems, and non-transitory computer-readable medium for detecting data anomalies on a device. For instance, the method may include: receiving an initial data measurement transmitted by the device, wherein the initial data measurement includes a measurement of data stored in the device using a unique key associated with the device; transmitting a request for a subsequent data measurement of data stored in the device; receiving the subsequent data measurement transmitted by the device; comparing the subsequent data measurement to the initial data measurement; and determining whether an anomaly exists in the data stored in the device based on the comparison.


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