The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Jul. 15, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Peng Hui Jiang, Beijing, CN;

Jun Su, Beijing, CN;

Yan Lin Ren, Shanghai, CN;

Zhang Li, Beijing, CN;

Hong Qing Zhou, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/2453 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24539 (2019.01); G06F 16/2393 (2019.01);
Abstract

Shared materialized views are maintained during data changes to the primary data and during creation of new materialized views. Shared data stored for use by shared materialized views is distinguished from data stored by an independent materialized view. A view selector manages data updates to shared materialized views and corresponding mapping table. The view selector directs movement of data between a shared materialized view and an independent materialized view through the lifecycle of the materialized views.


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