The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Jun. 09, 2020
Accenture Global Solutions Limited, Dublin, IE;
Jean-Luc Chatelain, Atlanta, GA (US);
Louis Gerald Farfan, Lomita, CA (US);
Teresa Sheausan Tung, Tustin, CA (US);
Fabio Bucci, Bologna, IT;
ACCENTURE GLOBAL SOLUTIONS LIMITED, Dublin, IE;
Abstract
The present disclosure relates to a system and a method for model control platform stack. The method includes, at an input layer of a model control platform stack, receiving input data. At a governance layer of the model control platform stack, the method includes maintaining a probe and model inventories; selecting a model, a monitoring location point, and a probe; and deploying, based on the selections of the probe and the model, a container to an orchestration layer of the model control platform stack. At the orchestration layer of the model control platform stack, the method includes accessing the container; using the container to deploy the probe and the model; scheduling an execution of the model to determine inference associated with the input data; during the execution, extracting probe data, using the probe, from the monitoring location point; and adjusting, based on the probe data and the inference, the model.