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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11822310 B1

PDFFull Text
Date of Patent:
Nov. 21, 2023

Filed:

Apr. 24, 2018

Increase in surface quality

Applicant:

Eos Gmbh Electro Optical Systems, Krailling, DE;

Inventors:

Ludger Hümmeler, Gauting, DE;

Christopher Schmitt, Munich, DE;

Assignee:

EOS GmbH Electro Optical Systems, Krailling, DE;

Attorney:

Polsinelli PC

Primary Examiner:

Monica A Huson

Assistant Examiner:

Kelsey C Grace

Int. Cl.
CPC ...
G05B 19/4099 (2006.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 40/00 (2020.01); B33Y 50/02 (2015.01); B29C 64/153 (2017.01); B29C 64/393 (2017.01); B29C 64/268 (2017.01); B29C 64/371 (2017.01); B22F 10/85 (2021.01); B22F 12/41 (2021.01); B22F 12/70 (2021.01); B22F 10/28 (2021.01); B28B 1/00 (2006.01); B28B 17/00 (2006.01); B22F 12/90 (2021.01); B22F 10/322 (2021.01); B22F 10/366 (2021.01); B22F 10/38 (2021.01); B22F 10/80 (2021.01);
U.S. Cl.
CPC ...
G05B 19/4099 (2013.01); B22F 10/28 (2021.01); B22F 10/322 (2021.01); B22F 10/366 (2021.01); B22F 10/38 (2021.01); B22F 10/80 (2021.01); B22F 10/85 (2021.01); B22F 12/41 (2021.01); B22F 12/70 (2021.01); B22F 12/90 (2021.01); B28B 1/001 (2013.01); B28B 17/0081 (2013.01); B29C 64/153 (2017.08); B29C 64/268 (2017.08); B29C 64/371 (2017.08); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 40/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

A method for providing control data for a generative layer construction device includes accessing layer data records that have data models of buildup material layers to be selectively solidified, where a base surface region of an object cross section exists in at least one layer data record, where in at least one of p layers below the base surface region, no solidification of buildup material is specified. The method further includes changing the layer data record such that a temporal sequence for scanning the associated object cross section with energy radiation is specified such that at least one portion of the base surface region is scanned before all other parts of the object cross section; and a third step, where the changed layer data record is provided for the generation of a control data record for the device.

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