The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Jan. 03, 2020
Nuctech (Beijing) Company Limited, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Yuanjing Li, Beijing, CN;
Li Zhang, Beijing, CN;
Jianmin Li, Beijing, CN;
Shangmin Sun, Beijing, CN;
Chunguang Zong, Beijing, CN;
Yu Hu, Beijing, CN;
Quanwei Song, Beijing, CN;
Hejun Zhou, Beijing, CN;
Weifeng Yu, Beijing, CN;
Jinguo Cao, Beijing, CN;
Bing Fu, Beijing, CN;
Abstract
The present disclosure provides a radiation inspection apparatus and a radiation inspection method. The radiation inspection apparatus includes: a radiation inspection device comprising a ray source and a detector that cooperates with the ray source to perform scanning inspection on an object to be inspected, the radiation inspection device having an inspection channel for the object to be inspected to pass through when scanning inspection is performed thereon; and traveling wheels provided at the bottom of the radiation inspection device to enable the radiation inspection apparatus to travel in an extension direction of the inspection channel, and the traveling wheels are configured to rotate 90° to enable the radiation inspection apparatus to travel in a direction perpendicular to the extension direction of the inspection channel.