The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Jan. 06, 2020
Applicants:

Tsinghua University, Beijing, CN;

Nuctech (Beijing) Company Limited, Beijing, CN;

Nuctech Company Limited, Beijing, CN;

Inventors:

Yanwei Xu, Beijing, CN;

Weifeng Yu, Beijing, CN;

Yu Hu, Beijing, CN;

Chunguang Zong, Beijing, CN;

Shangmin Sun, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/894 (2020.01); G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G01V 5/0016 (2013.01); G01S 17/894 (2020.01); G06V 2201/08 (2022.01);
Abstract

The present disclosure relates to a security scanning inspection system and method. The security scanning inspection system comprises a detector, a scanning device and a controller, wherein the detector is configured to detect a protective attribute of an object to be inspected; the scanning device is movably arranged and the scanning device is configured to emit a scanning ray during movement to perform a security scanning inspection on the object to be inspected, the scanning device comprising at least two working modes, wherein a dose of a scanning ray in each working mode is different from a dose of a scanning ray in any other working modes; and the controller configured to select a working mode of the scanning device according to the protective attribute of the object to be inspected detected by the detector.


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