The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Oct. 07, 2021
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

James Rohrkemper, Harbor Springs, MI (US);

Yifan Wu, San Diego, CA (US);

Guang C. Wang, San Diego, CA (US);

Kenny C. Gross, Escondido, CA (US);

Assignee:

ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/10 (2006.01);
U.S. Cl.
CPC ...
G01V 3/10 (2013.01);
Abstract

Embodiments for passive spychip detection through polarizability and advanced pattern recognition are described. For example a method includes inducing a magnetic field in a passive component of a target system while the target system is emitting EMI with changes in amplitude repeating at a time interval; generating a time series of measurements of a combined magnetic field strength of the induced magnetic field and the EMI; executing a frequency-domain to time-domain transformation on the time series of measurements to create time series signals of combined magnetic field strength over time at a specific frequency range; monitoring the time series signals with an ML model trained to predict correct signal values to determine whether predicted and measured values of the time series agree; and indicating that the target device may contain a passive spychip where anomalies are detected, and is free of passive spychips where no anomalies are detected.


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