The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Jul. 19, 2015
Applicant:

Elbit Systems Electro-optics Elop Ltd., Rehovot, IL;

Inventor:

Idit Pe'er, Ness Ziona, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/48 (2006.01); G01S 7/497 (2006.01); G01S 7/40 (2006.01); G01S 7/483 (2006.01); G01S 7/4863 (2020.01); F41G 3/32 (2006.01); F41G 3/14 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4972 (2013.01); G01S 7/40 (2013.01); G01S 7/483 (2013.01); G01S 7/4863 (2013.01); G01S 7/497 (2013.01); F41G 3/145 (2013.01); F41G 3/32 (2013.01);
Abstract

A system and method for analyzing quality criteria of a radiation spot are provided herein. The system may include: at least one controllable electromagnetic radiation source configured to generate and transmit a radiation beam onto an object, resulting in a radiation spot on said object; at least one radiation sensor configured to sense and obtain radiation reflections coming back from said object, wherein the radiation beam is generated in a way that reflections from different ranges are distinguishable of each other; and an analyzer configured to analyze said radiation reflections, and determine a remedy to the radiation beam, in a case that said radiation spot does not meet predefined spot validity criteria. The method may implement the aforementioned logic in a different architecture.


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