The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
May. 20, 2021
Applicant:
The Regents of the University of California, Oakland, CA (US);
Inventors:
Yuanxun Ethan Wang, Manhattan Beach, CA (US);
Lap Kun Yeung, Los Angeles, CA (US);
Kevin Luong, Los Angeles, CA (US);
Assignee:
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/24 (2006.01);
U.S. Cl.
CPC ...
G01R 33/24 (2013.01);
Abstract
A very low frequency (VLF) magnetic field sensor, using spins sourced from insulating ferrimagnetic materials or ferrites, which can achieve high sensitivities competitive with modern sensors while simultaneously maintaining a small size, low power consumption, simplicity of design, and low cost. The magnetic field sensor utilizes nonlinear resonant precession modulation (RPM) dynamics of subatomic spins to attain parametric amplification of a magnetic field.