Measurement system and method of measuring a device under test

Abstract

A measurement system for measuring a device under test is described. The measurement system includes a control and analysis module composed of one or more circuits, a stimulus module composed of one or more circuits, and a measurement interface composed of ,for example, one or more circuits. The stimulus module is configured to generate an electric stimulus signal based on predefined measurement parameters. The measurement system is configured to be connected to a device under test via the measurement interface. The measurement interface is configured to forward the electric stimulus signal from the stimulus module to the device under test. The measurement interface further is configured to forward a response signal from the device under test to the control and analysis module, wherein the response signal corresponds to a response of the device under test to the stimulus signal. The control and analysis module is configured to analyze the response signal, thereby generating a set of analysis data. The control and analysis module is further configured to compare the set of analysis data generated with a database. The database includes several measurement data sets being associated with different classes or types of devices under test. The control and analysis module is further configured to adapt the predefined measurement parameters of the stimulus module based on the comparison of the set of analysis data with the database. Further, a method of measuring a device under test is described.