The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Jul. 13, 2022
Applicant:

Charter Communications Operating, Llc, St. Louis, MO (US);

Inventors:

Diana Linton, Parker, CO (US);

Esteban Sandino, Greenwood Village, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 31/28 (2006.01); H04B 17/00 (2015.01);
U.S. Cl.
CPC ...
G01R 1/0416 (2013.01); G01R 31/2884 (2013.01); H04B 17/0085 (2013.01);
Abstract

A notched test signal is generated across a frequency band, the notched test signal includes a plurality of frequency notches, each frequency notch associated with one of a plurality of test frequencies. The notched test signal is provided to a device under test at a plurality of different input power levels. An notched output signal is received from the device under test. The notched output signal is filtered to provide a bandpass response at the plurality of test frequencies to generate a filtered notched output signal. A power level of the filtered notched output signal at each of the plurality of test frequencies is measured. A noise performance metric associated with the device under test is determined based at least in part on the power level of the filtered notched output signal.


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