The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

May. 25, 2022
Applicant:

Anton Paar Gmbh, Graz, AT;

Inventors:

Josef Gautsch, Graz, AT;

Helmut Gartler, Premstätten, AT;

Assignee:

Anton Paar GmbH, Graz, AT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2018.01); G01N 23/201 (2018.01); G01N 23/207 (2018.01); G01N 23/22 (2018.01); G01N 23/2206 (2018.01); G01N 23/20016 (2018.01); G01N 23/20025 (2018.01);
U.S. Cl.
CPC ...
G01N 23/2206 (2013.01); G01N 23/20016 (2013.01); G01N 23/20025 (2013.01); G01N 23/201 (2013.01); G01N 23/207 (2013.01); G01N 2223/045 (2013.01); G01N 2223/05 (2013.01); G01N 2223/071 (2013.01); G01N 2223/30 (2013.01); G01N 2223/317 (2013.01);
Abstract

A device for examining a sample by X-radiation having a radiation generation system for generating primary radiation, a first goniometer arm on which the radiation generation system is mounted and which is pivotable about a goniometer axis, a detection system configured to detect secondary radiation emanating from the sample, a second goniometer arm on which the detection system is mounted and which is pivotable about the goniometer axis, and an evacuable sample chamber within which the sample is arrangeable in a sample region encompassing a portion of the goniometer axis, the sample chamber being delimited by a sample chamber wall which has a transmission region which is transmissive to the primary radiation and is vacuum-tight, in order to allow the primary radiation to penetrate into the sample chamber and to impinge on the sample region at different angles of incidence.


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