The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Jun. 01, 2021
Applicants:

Jean-claude Diels, Albuquerque, NM (US);

Ladan Arissian, Albuquerque, NM (US);

Inventors:

Jean-Claude Diels, Albuquerque, NM (US);

Ladan Arissian, Albuquerque, NM (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/39 (2006.01); G01N 21/41 (2006.01); G01N 21/49 (2006.01); G01N 21/55 (2014.01); G01N 22/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/39 (2013.01); G01N 21/41 (2013.01); G01N 21/49 (2013.01); G01N 21/55 (2013.01); G01N 22/00 (2013.01); G01N 2021/4106 (2013.01); G01N 2201/06113 (2013.01);
Abstract

Apparatus, systems, and methods associated with remote phase and amplitude spectroscopy in frequency, time, and position with correlated frequency combs are applicable in a variety of applications. Multiple beams can be generated from a single laser source, where, in the frequency domain, the multiple beams are frequency combs with equal repetition rates and shifted in frequency from each other. One or more of the multiple beams can be directed to interact with a sample with another one of the multiple beams used as a reference beam. The interaction can include transmission of one of the multiple beams as a signal beam through the sample, reflection of one of the multiple beams as a signal beam from the sample, or backscattering from the sample. Results from the interaction can be analyzed.


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