The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Mar. 31, 2021
Applicant:

Yokogawa Electric Corporation, Tokyo, JP;

Inventors:

Risa Hara, Tokyo, JP;

Toshiyuki Saruya, Tokyo, JP;

Kodai Murayama, Tokyo, JP;

Fumie Watanabe, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3103 (2013.01); G01N 2021/258 (2013.01);
Abstract

A spectroscopic analysis device includes a detector and a processor. The detector detects measurement light obtained by irradiating, with irradiation light, a sample that contains a contained substance disposed on a film on which surface plasmons are generated. The measurement light includes information on an optical spectrum of the sample, and the information includes a resonance spectrum of the surface plasmons and an absorption spectrum of the sample. The processor calculates: a peak wavelength in a wavelength band in which the resonance spectrum and the absorption spectrum are generated; a peak absorbance of the contained substance based on an absorption band of the contained substance; and a ratio of the contained substance to the sample based on the peak wavelength and the peak absorbance.


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