The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Mar. 25, 2021
Pratt & Whitney Canada Corp., Longueuil, CA;
Julien Guay, Montreal, CA;
Mario Blais, Varennes, CA;
PRATT & WHITNEY CANADA CORP., Longueuil, CA;
Abstract
The present disclosure relates to methods and systems for validating a measurement machine. A group of validation measurements associated with a reference part is obtained. The group of validation measurements includes at least a first measurement associated with a first tolerance and a second measurement associated with a second tolerance, the second tolerance being smaller than the first tolerance. A dimension of the reference part associated with the first measurement is measured to obtain a measurement value. The measurement value is compared to a nominal value associated with the first measurement to obtain a measurement error. The measurement error is compared to the second tolerance associated with the second measurement. When the measurement error is less than the second tolerance, a validation signal is issued to the measurement machine.