The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Jul. 19, 2023
Applicant:

Mloptic Corp, Redmond, WA (US);

Inventors:

Pengfei Wu, Bellevue, WA (US);

Sophia Shiaoyi Wu, Bellevue, WA (US);

Assignee:

MLOptic Corp., Redmond, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/02 (2006.01);
U.S. Cl.
CPC ...
G01C 3/02 (2013.01);
Abstract

A method for providing an object distance of a device under test (DUT) using a system including a first lens, a second lens, an optical pinhole disposed between the first lens and the second lens, a detector, a pair of gratings disposed between the second lens and the detector, the detector configured for receiving a Moiré pattern formed as a result of light from of the DUT being disposed through the first lens, the optical pinhole, the second lens and the pair of gratings, the method including obtaining the Moiré pattern using the detector and determining the object distance based on the Moiré pattern and one or more properties of the pair of gratings.


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