The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Feb. 18, 2022
Qualcomm Incorporated, San Diego, CA (US);
Diyan Teng, Santa Clara, CA (US);
Junsheng Han, Los Altos Hills, CA (US);
Victor Kulik, San Jose, CA (US);
Mehul Soman, San Jose, CA (US);
Rashmi Kulkarni, Redwood City, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Systems and techniques are described herein. For example, a process can include obtaining first sensor measurement data associated with a and second sensor measurement from one or more sensors. In some cases, the first measurement data can be associated with a first time and the second sensor measurement data can be associated with a second time occurring after the first time. In some aspects, the process includes determining that the first sensor measurement data and the second sensor measurement data satisfy at least one batching condition. In some examples, the process includes, based on determining that the first sensor measurement data and the second sensor measurement data satisfy the at least one batching condition, generating a sensor measurement data batch including the first sensor measurement data, the second sensor measurement data, and at least one target sensor measurement data. Ins examples the process includes outputting the sensor measurement data batch.