The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Dec. 28, 2020
Fujifilm Corporation, Tokyo, JP;
Masayuki Ukishima, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
There is provided a machine learning model generation device, a machine learning model generation method, a program, an inspection device, an inspection method, and a printing device for inspecting a defect of a printed matter with high accuracy. A machine learning model for detecting the defect of the printed matter is generated by using, as learning input information, at least learning inspection data based on a captured image obtained by capturing an image of a printed matter as an inspection target and second learning reference data based on print digital data and using, as learning output information, at least learning defect information of the learning inspection data estimated by performing comparison processing of the learning inspection data and first learning reference data based on a captured image obtained by capturing the image of the printed matter.