The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Jun. 10, 2020
Applicant:

Sekisui Chemical Co., Ltd., Osaka, JP;

Inventors:

Jun Ishida, Shiga, JP;

Hiromitsu Nishino, Shiga, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 17/10 (2006.01); B32B 3/26 (2006.01); B32B 27/30 (2006.01);
U.S. Cl.
CPC ...
B32B 17/10568 (2013.01); B32B 3/263 (2013.01); B32B 17/10036 (2013.01); B32B 17/10761 (2013.01); B32B 27/30 (2013.01); B32B 2250/03 (2013.01); B32B 2250/40 (2013.01); B32B 2315/08 (2013.01); B32B 2329/06 (2013.01); B32B 2605/006 (2013.01); B32B 2605/08 (2013.01);
Abstract

Provided is an interlayer film for laminated glass with which transmitted double images in the laminated glass can be suppressed. An interlayer film for laminated glass according to the present invention has one end and the other end being at the opposite side of the one end, and the other end has a thickness larger than a thickness of the one end, and when an inclination of approximate line A and a maximum value of absolute values of deviation in partial wedge angle are calculated according to determination of a specific formula of approximate line A and calculation of deviation in partial wedge angle, the inclination of approximate line A is −0.05 mrad/m or less in at least one section A, and the maximum value of absolute values of deviation in partial wedge angle is 0.2 mrad or less.


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