The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

May. 17, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Hirotoshi Torii, Tochigi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 59/02 (2006.01); G03F 7/00 (2006.01); B29C 33/42 (2006.01);
U.S. Cl.
CPC ...
B29C 59/02 (2013.01); B29C 33/424 (2013.01); G03F 7/0002 (2013.01);
Abstract

An imprint apparatus that forms a pattern of an imprint material on a substrate using a mold is described. The apparatus includes a measurement unit that measures one of a displacement and a position of a second surface opposite to a first surface on a side of a pattern region of the mold in a portion of the mold. The portion includes the pattern region and is deformed into a convex shape toward a side of the substrate upon bringing the imprint material on the substrate and the pattern region into contact with each other. The apparatus also includes a control unit that controls a distance between the mold and the substrate based on a measurement value of the measurement unit, such that a shape of the pattern region is kept constant upon curing the imprint material.


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