The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Jul. 16, 2021
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Ryutaro Seki, Shiojiri, JP;

Atsushi Toyofuku, Shiojiri, JP;

Tomonori Mano, Shiojiri, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); B25J 13/08 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1638 (2013.01); B25J 9/1692 (2013.01); B25J 13/088 (2013.01);
Abstract

An overshoot amount detection method includes a synchronization step of synchronizing a signal of an inertial sensor with a signal of an encoder based on a first synchronizing signal output from the inertial sensor during a signal synchronizing operation and a second synchronizing signal output from the encoder during the signal synchronizing operation, a signal generation step of generating a first signal by twice integration of a first detection signal output from the inertial sensor during a working operation and removal of a low-frequency component contained in the first detection signal and generating a second signal for supplement of the low-frequency component of the first signal from a second detection signal output from the encoder during the working operation, and an overshoot amount detection step of detecting an overshoot amount of an arm based on the first signal and the second signal.


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