The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Jul. 24, 2018
Applicant:
The Regents of the University of Michigan, Ann Arbor, MI (US);
Inventors:
Assignee:
THE REGENTS OF THE UNIVERSITY OF MICHIGAN, Ann Arbor, MI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 1/00 (2006.01); A61B 1/04 (2006.01); A61B 1/06 (2006.01); A61B 1/07 (2006.01); G02B 21/00 (2006.01); G02B 23/24 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0068 (2013.01); A61B 1/00096 (2013.01); A61B 1/00172 (2013.01); A61B 1/00177 (2013.01); A61B 1/00193 (2013.01); A61B 1/043 (2013.01); A61B 1/0623 (2013.01); A61B 1/0638 (2013.01); A61B 1/07 (2013.01); A61B 5/0071 (2013.01); G02B 21/0028 (2013.01); G02B 21/0048 (2013.01); G02B 21/0076 (2013.01); G02B 23/2461 (2013.01);
Abstract
An optical probe assembly as a confocal endomicroscope includes an optical focusing stage that focuses an output beam onto a sample and a mirror scanning stage that is movable for scanning the output beam in both a lateral two dimensional plane and an axial direction, using a side-view configuration. The side-view configuration allows for output beam illumination and fluorescent imaging of the sample with greater imaging resolution and improved access to hard to reach tissue within a subject.