The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2023
Filed:
Apr. 06, 2021
Qualcomm Incorporated, San Diego, CA (US);
Vasanthan Raghavan, West Windsor Township, NJ (US);
Alexander Dorosenco, El Cajon, CA (US);
Tao Luo, San Diego, CA (US);
Robert Douglas, San Diego, CA (US);
Jeremy Darren Dunworth, La Jolla, CA (US);
Junyi Li, Franklin Park, NJ (US);
Allen Minh-Triet Tran, Rancho Santa Fe, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods, systems, and devices for wireless communications are described for self-interference or cross-link interference measurements at a user equipment (UE). A UE may receive configuration information from a base station that indicates one or more slot format index (SFI) values that are compatible for cross-link interference or self-interference measurements. Based on the configured SFI(s), the UE may measure interference in multiple symbols, which may be used to estimate an amount of cross-link interference or self-interference, and the UE may transmit a measurement report to the base station. The base station, based on the measurement report, may identify one or more compatible SFIs, beam pairs, or combinations thereof, for subsequent communications with one or more UEs. The interference measurements may identify cross-link interference at the UE that results from transmissions of a different UE, or may identify self-interference of concurrent communications of multiple channels at a same UE.