The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

May. 05, 2022
Applicant:

Anhui University, Hefei, CN;

Inventors:

Jie Chen, Hefei, CN;

Jianming Lv, Hefei, CN;

Zihan Cheng, Hefei, CN;

Zhixiang Huang, Hefei, CN;

Haitao Wang, Hefei, CN;

Bing Li, Hefei, CN;

Huiyao Wan, Hefei, CN;

Yun Feng, Hefei, CN;

Assignee:

Anhui University, Hefei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2023.01); G06V 20/70 (2022.01); G06V 10/82 (2022.01); G06V 10/34 (2022.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); G06T 3/4038 (2013.01); G06V 10/34 (2022.01); G06V 10/82 (2022.01); G06V 20/70 (2022.01);
Abstract

The present disclosure provides a fire source detection method and device under the condition of a small sample size, and a storage medium, and belongs to the field of target detection and industrial deployment. The method includes the steps of acquiring fire source image data from an industrial site; constructing a fire source detection model; inputting the fire source image data to the fire source detection model, and analyzing the fire source image data via the fire source detection model to obtain a detection result, where the detection result includes a specific location, precision and type of a fire source. By means of the method, the problems of insufficient sample capacity and difficulty in training under the condition of a small sample size are solved, and different enhancement methods are used to greatly increase the number and quality of samples and improve the over-fitting ability of models.


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