The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2023
Filed:
Jul. 26, 2022
Apple Inc., Cupertino, CA (US);
Jia Tang, San Jose, CA (US);
Beibei Wang, San Jose, CA (US);
Dawei Zhang, Saratoga, CA (US);
Haitong Sun, Irvine, CA (US);
Johnson O. Sebeni, Fremont, CA (US);
Pengkai Zhao, San Jose, CA (US);
Ping Wang, San Jose, CA (US);
Wei Zeng, Sang Diego, CA (US);
Yang Li, Santa Clara, CA (US);
Zhu Ji, San Jose, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Apparatuses, systems, and methods for a wireless device to perform methods to implement mechanisms for a UE to request a beam quality measurement procedure. A user equipment device may be configured to perform a method including performing transmitting a request to perform a beam quality measurement procedure for downlink receptions (e.g., a P3 procedure) to a base station/network entity, receiving instructions to perform the beam quality measurement procedure from the base station, and transmitting results of the beam quality measurement procedure to the base station. In some embodiments, transmission of the request may be response to at least one trigger condition and/or detection of a condition at the UE. The request may include an indication of a preferred timing offset. The instructions to perform the beam quality measurement procedure may include a schedule for the beam quality measurement.