The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Jan. 19, 2021
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Junichi Koezuka, Tochigi, JP;

Kenichi Okazaki, Tochigi, JP;

Yukinori Shima, Tatebayashi, JP;

Yasutaka Nakazawa, Tochigi, JP;

Yasuharu Hosaka, Tochigi, JP;

Shunpei Yamazaki, Setagaya, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/786 (2006.01); H01L 21/02 (2006.01); H01L 29/24 (2006.01); H01L 29/66 (2006.01); H01L 27/12 (2006.01); H01L 27/02 (2006.01); G06F 3/044 (2006.01); G06F 3/041 (2006.01); G02F 1/1368 (2006.01); G02F 1/1333 (2006.01); H10K 59/121 (2023.01);
U.S. Cl.
CPC ...
H01L 29/78696 (2013.01); G06F 3/044 (2013.01); G06F 3/0412 (2013.01); H01L 21/02554 (2013.01); H01L 21/02565 (2013.01); H01L 21/02631 (2013.01); H01L 27/0296 (2013.01); H01L 27/127 (2013.01); H01L 27/1225 (2013.01); H01L 27/1259 (2013.01); H01L 29/24 (2013.01); H01L 29/66969 (2013.01); H01L 29/7869 (2013.01); H01L 29/78606 (2013.01); H01L 29/78648 (2013.01); G02F 1/1333 (2013.01); G02F 1/1368 (2013.01); G02F 1/13338 (2013.01); G02F 1/13685 (2021.01); H10K 59/1213 (2023.02);
Abstract

A semiconductor device with favorable electrical characteristics is to be provided. A highly reliable semiconductor device is to be provided. A semiconductor device with lower power consumption is to be provided. The semiconductor device includes a gate electrode, a first insulating layer over the gate electrode, a metal oxide layer over the first insulating layer, a pair of electrodes over the metal oxide layer, and a second insulating layer over the pair of electrodes. The first insulating layer includes a first region and a second region. The first region has a region being in contact with the metal oxide layer and containing more oxygen than the second region. The second region has a region containing more nitrogen than the first region. The metal oxide layer has at least a concentration gradient of oxygen in a thickness direction, and the concentration gradient becomes high on a first region side and on a second region side.


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