The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Apr. 10, 2020
Applicant:

Agilent Technologies, Inc., Santa Clara, CA (US);

Inventors:

Stephen P. Madden, Campbell, CA (US);

Steven M. Fischer, Hayward, CA (US);

Assignee:

AGILENT TECHNOLOGIES, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16C 20/30 (2019.01); G16C 20/70 (2019.01); G16C 20/50 (2019.01); G16H 10/40 (2018.01);
U.S. Cl.
CPC ...
G16C 20/30 (2019.02); G16C 20/50 (2019.02); G16C 20/70 (2019.02); G16H 10/40 (2018.01);
Abstract

A method for analyzing samples utilizing stable label isotope tracing includes receiving mass spectrometry (MS) data generated by an MS system performing untargeted data acquisition on a plurality of samples, performing untargeted feature extraction on the unlabeled compound data to generate a data set of first extracted features, generating a plurality of empirical molecular formulas respectively corresponding to the first extracted features, performing targeted isotopologue extraction on the labeled compound data to generate a data set of second extracted features, wherein the targeted isotopologue extraction is based on the empirical molecular formula and retention time of each first extracted feature, and identifying one or more groups of isotopologues from the second extracted features.


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