The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Dec. 06, 2021
Applicant:

Seagate Technology Llc, Fremont, CA (US);

Inventors:

Ara Patapoutian, Rancho Santa Fe, CA (US);

Jason Charles Jury, Apple Valley, MN (US);

Assignee:

Seagate Technology LLC, Fremont, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 20/18 (2006.01); G11C 29/42 (2006.01); G11B 19/04 (2006.01); G11C 29/52 (2006.01); H04L 43/024 (2022.01); H03M 13/37 (2006.01); G11B 7/09 (2006.01); G11B 20/12 (2006.01);
U.S. Cl.
CPC ...
G11B 20/1876 (2013.01); G11B 20/1803 (2013.01); G06F 2211/109 (2013.01); G11B 7/094 (2013.01); G11B 19/041 (2013.01); G11B 20/1258 (2013.01); G11B 20/18 (2013.01); G11B 20/1816 (2013.01); G11B 2020/1222 (2013.01); G11C 29/42 (2013.01); G11C 29/52 (2013.01); H03M 13/3715 (2013.01); H04L 43/024 (2013.01);
Abstract

A method of recovering data from one or more failed data sectors includes estimating a reader offset position from a first or a second read attempt of the one or more failed data sectors at a current set of channel parameters and basing the estimated reader offset position on, at least in part, a position error signal generated during the first or second read attempt. At least one read is performed on the one or more failed data sectors at the estimated reader offset position to obtain one or more samples. The one or more samples are processed to obtain a processed sample. Iterative outer code recovery is performed on the processed sample.


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