The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2023
Filed:
Sep. 04, 2019
Shiseido Company, Ltd., Tokyo, JP;
Yuji Masuda, Tokyo, JP;
Megumi Sekino, Tokyo, JP;
Hironobu Yoshikawa, Tokyo, JP;
David Christopher Berends, Princeton, NJ (US);
Michael Anthony Isnardi, Princeton, NJ (US);
Yuzheng Zhang, Princeton, NJ (US);
Shiseido Company, Ltd., Tokyo, JP;
Abstract
An image analysis device according to the present invention includes: an image capturing unit that captures a subject; a light emitting unit that emits light to the subject; a sensor unit that senses an inclination of the image capturing unit relative to the subject; a control unit that causes the image capturing unit to capture an image of the subject while controlling light emission of the light emitting unit; and a determination unit that, based on a positional relationship of the image capturing unit and the light emitting unit and the inclination, determines a measurement region spaced apart by a predetermined distance from a reflection region corresponding to a position in the image where a light from the light emitting unit regularly reflects at the subject.