The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2023
Filed:
Jan. 18, 2019
Applicant:
Vuno, Inc., Seoul, KR;
Inventor:
Kyuhwan Jung, Seoul, KR;
Assignee:
VUNO INC., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 3/4053 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20108 (2013.01); G06T 2207/30096 (2013.01);
Abstract
The present invention relates to a method for reconstructing an image and an apparatus using the same Particularly, according to the method of the present invention, when a series of first slice images of a subject are inputted in a computing device, the computing device generates, from the first slice images, second slice images having a second slice thickness different from a first thickness, which is the slice thickness of the first slice image, and provides the generated second slice images.
Quick Actions:
Jung, Kyuhwan. (2023). Method for reconstructing series of slice images and apparatus using same (U.S. Patent No. 11816833). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11816833
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