The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2023
Filed:
Mar. 20, 2023
Shenzhen Technology University, Shenzhen, CN;
LeiFeng Cao, Shenzhen, CN;
Jian Yu, Shenzhen, CN;
Xue Wang, Shenzhen, CN;
Jialing Deng, Shenzhen, CN;
Dikai Li, Shenzhen, CN;
Yanmeng Dai, Shenzhen, CN;
Chunhui Zhang, Shenzhen, CN;
Cangtao Zhou, Shenzhen, CN;
Shuangchen Ruan, Shenzhen, CN;
SHENZHEN TECHNOLOGY UNIVERSITY, Shenzhen, CN;
Abstract
A super-resolution X-ray shadowgraph system includes an X-ray source, a sample stage, an X-ray detector and an image reconstruction device, which are arranged in sequence. Geometric centers of the X-ray source, the sample stage and the X-ray detector are collinear. The geometric center of the sample stage is provided with a through hole for placing a testing sample, the X-ray source is used for providing X-rays, and the X-rays penetrate the sample stage to form an image on the X-ray detector. The image reconstruction device is used for acquiring the image and performing an image reconstruction on the image to obtain a new image. The shadowgraph system and the imaging method therefor can overcome a deficiency of a lower resolution of the image limited by a size of the source, thereafter obtaining a clear shadowgraph with a high resolution.