The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2023
Filed:
Feb. 10, 2021
Omron Corporation, Kyoto, JP;
Lin Miao, Higashiosaka, JP;
Xingdou Fu, Kizugawa, JP;
OMRON CORPORATION, Kyoto, JP;
Abstract
A measurement parameter for use when measuring an object with a measuring device provided on a robot may be adjusted and optimized significantly more easily than in conventional technology. A measurement parameter optimization method or operations performed by a processor may include: acquiring N captured images of objects with first measurement parameters; estimating recognized object counts Zi for the objects based on acquiring N/j captured images of the objects with second measurement parameters, and storing the recognized object counts Zi as first data; based on acquiring N/j/k captured images of the objects with third measurement parameters, estimating recognized object counts Zi for the objects based on the first data and storing the recognized object counts Zi as second data; and determining an optimized measurement parameter that satisfies a predetermined judgment criterion from among the second data.