The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Aug. 23, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Leonid Karlinsky, Mazkeret Batya, IL;

Joseph Shtok, Binyamina, IL;

Eliyahu Schwartz, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 7/01 (2023.01); G06F 16/55 (2019.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01);
U.S. Cl.
CPC ...
G06N 7/01 (2023.01); G06F 16/55 (2019.01); G06N 20/00 (2019.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01);
Abstract

Embodiments may include novel techniques for Task-Adaptive Feature Sub-Space Learning (TAFSSL). For example, in an embodiment, a method may be implemented in a computer system comprising a processor, memory accessible by the processor, and computer program instructions stored in the memory and executable by the processor, the method comprising: training a machine learning system to classify features in images by: generating a sample set comprising one or a few labeled training samples and one or a few additional samples containing instances of target classes, performing dimensionality reduction computed on the samples in the sample set to form a dimension reduced sub-space, generating class representatives in the dimension reduced sub-space using clustering, and classifying features in images using the trained machine learning system.


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