The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2023
Filed:
Feb. 26, 2021
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Petr Novotny, Mount Kisco, NY (US);
Aindrila Basak, Edmonton, CA;
Shaikh Shahriar Quader, Scarborough, CA;
Horst Cornelius Samulowitz, Armonk, NY (US);
Chad Marston, Bolton, MA (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/26 (2019.01); G06F 16/215 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 16/26 (2019.01); G06F 16/215 (2019.01); G06N 20/00 (2019.01);
Abstract
A quality determination method, system, and computer program product that includes performing a dimensionality reduction on a high-dimensional dataset to form a dimensional-reduced dataset and determining, using a machine learning tool executed on a computing device, a quality of the dimensional-reduced dataset via a review of an extracted feature extracted from the dimensional-reduced dataset.