The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

May. 18, 2022
Applicant:

Snap Inc., Santa Monica, CA (US);

Inventors:

Michael Cieslak, Los Angeles, CA (US);

Jiayao Yu, Venice, CA (US);

Kai Chen, Manhattan Beach, CA (US);

Farnaz Azmoodeh, Venice, CA (US);

Michael David Marr, Monroe, WA (US);

Jun Huang, Beverly Hills, CA (US);

Zahra Ferdowsi, Marina del Rey, CA (US);

Olamide Valerie Olatunji, Los Angeles, CA (US);

David Boyle, Santa Monica, CA (US);

Claire Reinert, Seattle, WA (US);

Assignee:

Snap Inc., Santa Monica, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3423 (2013.01); G06F 11/1479 (2013.01); G06F 11/3495 (2013.01);
Abstract

Systems, devices, media, and methods are presented for releasing an application feature in incremental stages while monitoring the application for anomalies. The feature includes a package of code and an action setting. The methods in some implementations include identifying active devices on which the application has been installed, monitoring the application according to a set of metrics, activating the feature by changing its action setting for a first segment of the active devices, pausing the feature if an anomaly is detected among the set of metrics, and generating a repair ticket. As long as no anomaly is detected, the activating step proceeds for subsequent segments of the active devices, iteratively, until the release is completed. A feature rank may be used to process and release a plurality of features in order of priority.


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